Computerized tomography based on X-ray refraction information

Conventional computerized tomography reconstructs the object by using the projection images which are imaged based on the absorption differences of substances to X-ray. In recent years, X-ray phase-contrast CT technique has been developed rapidly. Diffraction enhanced imaging (DEI) method is one of the three phase-sensitive X-ray imaging techniques which can be used for CT. DEI method can provide higher spatial resolution and distinguish more little differences in density by using monochromatic X-ray from synchrotron light sources than conventional absorption method. It can extract sample's refraction, absorption and scattering information by using an analyser crystal in DEI. This paper discusses the CT reconstruction criteria based on DEI and reconstructs two sample's 2D images and their 3D images. The reconstructed result is better than that of the absorption CT, which proves that the DEI-CT can be a powerful method for use in clinical tomography and material science

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