Harnessing Machine Learning to Improve the Success Rate of Stimuli Generation
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Yishay Mansour | Avi Ziv | Yehuda Naveh | Itai Jaeger | Shai Fine | Ari Freund | Y. Mansour | S. Fine | A. Freund | Itai Jaeger | Y. Naveh | A. Ziv | Ari Freund
[1] Dana Angluin,et al. Queries and concept learning , 1988, Machine Learning.
[2] Judea Pearl,et al. Probabilistic reasoning in intelligent systems - networks of plausible inference , 1991, Morgan Kaufmann series in representation and reasoning.
[3] A. Hasman,et al. Probabilistic reasoning in intelligent systems: Networks of plausible inference , 1991 .
[4] W. Näther. Optimum experimental designs , 1994 .
[5] 大西 仁,et al. Pearl, J. (1988, second printing 1991). Probabilistic Reasoning in Intelligent Systems: Networks of Plausible Inference. Morgan-Kaufmann. , 1994 .
[6] Yishay Mansour,et al. Learning Boolean Functions via the Fourier Transform , 1994 .
[7] Cathy May,et al. The PowerPC Architecture: A Specification for a New Family of RISC Processors , 1994 .
[8] Aharon Aharon,et al. Test Program Generation for Functional Verification of PowePC Processors in IBM , 1995, 32nd Design Automation Conference.
[9] David Heckerman,et al. Causal independence for probability assessment and inference using Bayesian networks , 1996, IEEE Trans. Syst. Man Cybern. Part A.
[10] Avi Ziv,et al. User defined coverage—a tool supported methodology for design verification , 1998, DAC.
[11] Laurent Fournier,et al. Functional verification methodology for microprocessors using the Genesys test-program generator. Application to the x86 microprocessors family , 1999, Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078).
[12] Laurent Fournier,et al. Functional verification methodology for microprocessors using the Genesys test-program generator , 1999, DATE '99.
[13] Edmund M. Clarke,et al. Model Checking , 1999, Handbook of Automated Reasoning.
[14] Tom Shanley,et al. Infiniband Network Architecture , 2002 .
[15] Allon Adir,et al. Adaptive test program generation: planning for the unplanned , 2002, Seventh IEEE International High-Level Design Validation and Test Workshop, 2002..
[16] Yehuda Naveh,et al. X-Gen: a random test-case generator for systems and SoCs , 2002, Seventh IEEE International High-Level Design Validation and Test Workshop, 2002..
[17] Avi Ziv,et al. Using a constraint satisfaction formulation and solution techniques for random test program generation , 2002, IBM Syst. J..
[18] Avi Ziv,et al. Hole analysis for functional coverage data , 2002, DAC '02.
[19] Avi Ziv,et al. Coverage directed test generation for functional verification using Bayesian networks , 2003, Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451).
[20] Allon Adir,et al. Genesys-Pro: innovations in test program generation for functional processor verification , 2004, IEEE Design & Test of Computers.
[21] Andrew Piziali,et al. Functional verification coverage measurement and analysis , 2004 .
[22] Wolfgang Roesner,et al. Comprehensive Functional Verification: The Complete Industry Cycle (Systems on Silicon) , 2005 .
[23] Wolfgang Roesner,et al. Comprehensive Functional Verification: The Complete Industry Cycle , 2005 .
[24] David Heckerman,et al. A Tutorial on Learning with Bayesian Networks , 1999, Innovations in Bayesian Networks.