Expected Improvement-Based Optimization Approach for the Optimal Sizing of a CMOS Operational Transconductance Amplifier

In this paper we consider the use of a new Kriging metamodeling technique for the efficient global optimization of analog circuits. It is based on the use of the socalled expected improvement criterion for the enhancement of the considered performance model. The efficiency of this approach, regarding to accuracy and computation time, is showcased via an example of the optimal sizing of a CMOS operational transconductance amplifier. A comparative study with performances of the conventional in-loop sizing technique, where the particle swarm optimization metaheuristic is used as the core of the optimization kernel, is presented.

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