Y. Goto

发表

H. Sekiguchi, K. Ozaki, S. Wakana, 1996, Proceedings International Test Conference 1996. Test and Design Validity.

H. Sekiguchi, K. Ozaki, S. Wakana, 1997, Proceedings Sixth Asian Test Symposium (ATS'97).

T. Ozaki, Y. Goto, J. Yoshida, 1981, 18th Design Automation Conference.

Takeo Kanade, Jon A. Webb, Jill D. Crisman, 1986, Proceedings. 1986 IEEE International Conference on Robotics and Automation.